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Proceedings Paper

Automated Dimensional Analysis Using A Light-Sectioning Microscope
Author(s): John Loomis; Allan Lightman; Allen Poe; Roger Caldwell
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Paper Abstract

A computer vision system has been integrated with a modified light-sectioning microscope for the quality control and inspection of a machined part whose critical dimensions are in the range of 30 to 300 μm. Height measurements were determined by analysis of the projected light-section line. Transverse measurements were made using the microscope in a traditional configuration with illumination from selected elements of an external LED ring array. The light section irradiance was under computer control to accommodate the spatial variations in surface reflectance whose dynamic range exceeded that of the vision system. Part features are located by the vision system. Edges and line centers are then measured to sub-pixel resolution with a gray-level analysis algorithm. This paper describes the design and operation of this system. Details of the measurement process and analysis algorithms are provided.

Paper Details

Date Published: 1 May 1989
PDF: 11 pages
Proc. SPIE 1036, Precision Instrument Design, (1 May 1989); doi: 10.1117/12.950976
Show Author Affiliations
John Loomis, The University of Dayton Research Institute (United States)
Allan Lightman, The University of Dayton Research Institute (United States)
Allen Poe, Mound Laboratories (United States)
Roger Caldwell, Mound Laboratories (United States)

Published in SPIE Proceedings Vol. 1036:
Precision Instrument Design
Thomas C. Bristow; Alson E. Hatheway, Editor(s)

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