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Proceedings Paper

Waveguide Diffraction Gratings In Integrated Optics
Author(s): L. A. Weller-Brophy; D. G. Hall
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Paper Abstract

A discussion of the various TE-TE and TM-TM coupling coefficients derived for both normal and oblique incidence to the rulings of a corrugated waveguide diffraction grating is presented. It is shown that the substantial disparity between the TM-TM coupling coefficients can result in vastly different predictions of peak grating reflectivity. We conclude that experimental examination of the coupling coefficients is necessary before the accurate design and analysis of waveguide gratings can be achieved.

Paper Details

Date Published: 11 September 1985
PDF: 5 pages
Proc. SPIE 0578, Integrated Optical Circuit Engineering II, (11 September 1985); doi: 10.1117/12.950766
Show Author Affiliations
L. A. Weller-Brophy, University of Rochester (United States)
D. G. Hall, University of Rochester (United States)

Published in SPIE Proceedings Vol. 0578:
Integrated Optical Circuit Engineering II
Sriram Sriram, Editor(s)

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