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Proceedings Paper

Thin-film Photodetectors For Integrated Optics
Author(s): M. L. McWright; T. E. Batchman; R. F. Carson
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Paper Abstract

Metal-silicon-metal cladding layers on dielectric waveguides exhibit coupling and absorption characteristics which make them useful as high-efficiency thin-film photodetectors for integrated optical applications. Periodic coupling between the guided mode of the lossless waveguide and the lossy modes supported by the semiconductor cladding produces an oscillatory behavior as the semiconductor thickness is increased. A high level of energy transfer from the waveguide to the semiconductor can be obtained, thereby maximizing detector absorption.

Paper Details

Date Published: 11 September 1985
PDF: 6 pages
Proc. SPIE 0578, Integrated Optical Circuit Engineering II, (11 September 1985); doi: 10.1117/12.950746
Show Author Affiliations
M. L. McWright, University of Virginia (United States)
T. E. Batchman, University of Virginia (United States)
R. F. Carson, University of Virginia (United States)

Published in SPIE Proceedings Vol. 0578:
Integrated Optical Circuit Engineering II
Sriram Sriram, Editor(s)

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