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Proceedings Paper

Refractive Index Measurements Of Lithium Niobate Integrated Optical Substrates By Total Internal Reflection
Author(s): G. E. Peterson; S. R. Lunt; R. J. Holmes; Y. S. Kim
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Paper Abstract

The measurement of the refractive index of lithium niobate integrated optical substrates of various stoichiometries is difficult because of their thinness (≈l mm). We use a prism coupling method and calculate the refractive index from the angle at which the intensity of the light from the total internal reflection in the prism base drops. The equipment is computer controlled. In addition, the method can be used to analyze lithium niobate boules to ascertain if they are potentially useful for substrates.

Paper Details

Date Published: 11 September 1985
PDF: 9 pages
Proc. SPIE 0578, Integrated Optical Circuit Engineering II, (11 September 1985); doi: 10.1117/12.950743
Show Author Affiliations
G. E. Peterson, AT&T Bell Laboratories (United States)
S. R. Lunt, AT&T Bell Laboratories (United States)
R. J. Holmes, AT&T Bell Laboratories (United States)
Y. S. Kim, AT&T Bell Laboratories (United States)

Published in SPIE Proceedings Vol. 0578:
Integrated Optical Circuit Engineering II
Sriram Sriram, Editor(s)

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