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Proceedings Paper

Measurement of 1/f Noise of HgCdTe, PtSi, and InSb
Author(s): A. L. Vinson; E. L. Dereniak
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Paper Abstract

This paper describes a preliminary investigation of l/f noise in three infrared detector materials used in the MWIR (3-5um). Noise measurements of HgCdTe, PtSi, and InSb detectors were conducted and the results are presented. The various noise sources are discussed.

Paper Details

Date Published: 23 February 1985
PDF: 6 pages
Proc. SPIE 0572, Infrared Technology XI, (23 February 1985); doi: 10.1117/12.950680
Show Author Affiliations
A. L. Vinson, University of Arizona (United States)
E. L. Dereniak, University of Arizona (United States)

Published in SPIE Proceedings Vol. 0572:
Infrared Technology XI
Richard A. Mollicone; Irving J. Spiro, Editor(s)

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