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Proceedings Paper

Performance of a LSM Spectrogoniometer For Characteristic X-ray lines
Author(s): M. Arbaoui; R. Barchewitz; J. M. Andre; Y. Lepetre; R. Rivoira
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Paper Abstract

A spectrogoniometer designed to measure the quality of X-ray and X-UV dispersive devices is described. The reflgctivityoof Laye;ed Synthetic Microstructures (LSM's) is presented at three wavelengths (13 Å, 44.8 Å, 67.7 Å) corresponding to the emission lines of Cu, C and B respectively, emitted from a windowless X-ray tube. In particular, performance of Fabry-Perot etalons in the soft X-ray range is discussed. The observation of Cu 2p emission spectrum obtained with an optimized LSM dispersor provides a specific example of LSM's possibilities for X-ray spectroscopy.

Paper Details

Date Published: 6 May 1985
PDF: 8 pages
Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949692
Show Author Affiliations
M. Arbaoui, Universite Pierre et Marie Curie (France)
R. Barchewitz, Universite Pierre et Marie Curie (France)
J. M. Andre, Universite Pierre et Marie Curie (France)
Y. Lepetre, Universite d'Aix-Marseille III (France)
R. Rivoira, Universite d'Aix-Marseille III (France)

Published in SPIE Proceedings Vol. 0563:
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Gerald F. Marshall, Editor(s)

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