Proceedings Paper
Simplified X-Ray Multilayer Reflectivity Calculations Using Lossy Transmission Line Theory| Format | Member Price | Non-Member Price |
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Paper Abstract
Lossy transmission line theory is shown to be a physically meaningful technique for calculating the reflectivity of thin-film multilayer structures with complex indices of refraction. The problem is approached by treating each layer as a transmission line characterized by a given impedance. Reflections are naturally due to impedance mismatches; the impedance is shown to be simply the ratio of the electric and magnetic fields of the plane waves. Both normal and oblique incidence results match conventional calculations, but the transmission line approach requires minimal coding.
Paper Details
Date Published: 6 May 1985
PDF: 8 pages
Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949686
Published in SPIE Proceedings Vol. 0563:
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Gerald F. Marshall, Editor(s)
PDF: 8 pages
Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); doi: 10.1117/12.949686
Show Author Affiliations
Paul D. Rockett, KMS Fusion Inc. (United States)
James H. Lupton, University of Michigan (United States)
Published in SPIE Proceedings Vol. 0563:
Applications of Thin Film Multilayered Structures to Figured X-Ray Optics
Gerald F. Marshall, Editor(s)
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