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Proceedings Paper

Computer-Aided Surface Analysis la Fringe Projection
Author(s): Oliverio D.D. Soares; Silverio P. Almeida; Augusto O.S. Gomes
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Paper Abstract

Three-dimensional topography of non-optical surfaces has been measured by projection fringe interferometry and developed computer algorithm decoding. Fundamental parameters characterizing the roughness of tested surface were evaluated. The resolution dynamic range was shown to present a large span from submicron to millimeters according to frequency carrier adjustment. The demonstrated technique has presented significant advantages over mechanical based profilometry and other optical techniques. However, the application of the method appears to extend beyond conventional mechanical surface analysis. Further, it was brought to evidence the possibilities of conceiving other methods of surface topographic metrology by laser beam modulation.

Paper Details

Date Published: 15 February 1989
PDF: 7 pages
Proc. SPIE 1010, Industrial Inspection, (15 February 1989); doi: 10.1117/12.949253
Show Author Affiliations
Oliverio D.D. Soares, Universidade do Porto (Portugal)
Silverio P. Almeida, Virginia Polytechnic and State University (United States)
Augusto O.S. Gomes, Universidade do Porto (Portugal)

Published in SPIE Proceedings Vol. 1010:
Industrial Inspection
Donald W. Braggins, Editor(s)

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