Proceedings Paper
Optical Triangulation Using A CCD Array With Sub-Pixel Resolution| Format | Member Price | Non-Member Price |
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Paper Abstract
The design of an optical triangulation gauge based upon a linear CCD array operating with sub-pixel resolution is described. Experimental results are presented that demonstrate the basic performance characteristics of the system and its ability to perform rapid measurements on complex engineering objects with accuracies in the range 2 to 5 µm.
Paper Details
Date Published: 15 February 1989
PDF: 6 pages
Proc. SPIE 1010, Industrial Inspection, (15 February 1989); doi: 10.1117/12.949197
Published in SPIE Proceedings Vol. 1010:
Industrial Inspection
Donald W. Braggins, Editor(s)
PDF: 6 pages
Proc. SPIE 1010, Industrial Inspection, (15 February 1989); doi: 10.1117/12.949197
Show Author Affiliations
Robert Jones, Cambridge Consultants Ltd. (United Kingdom)
Lucy Rowbotham, Cambridge Consultants Ltd. (United Kingdom)
Lucy Rowbotham, Cambridge Consultants Ltd. (United Kingdom)
Michael Pritchett, Cambridge Consultants Ltd. (United Kingdom)
Published in SPIE Proceedings Vol. 1010:
Industrial Inspection
Donald W. Braggins, Editor(s)
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