
Proceedings Paper
Pattern Recognition Using A CMAC Based Learning SystemFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper presents a new approach to image feature vector classification based on the Cerebellar Model Arithmetic Computer (CMAC) neural network proposed by Albus. This approach promises advantages both over traditional methods for feature vector classification and over other neural network based classifiers. One advantage is that the generalization properties inherent in the network allow the formation of highly nonlinear decision boundaries, and allow multiple disjoint regions of feature space to be defined in the same class. A second advantage is that the computation time required for network training and for vector classification is greatly reduced relative to other nonlinear classification techniques. Results from several classification experiments are presented, including the investigation of the effects of noise on classifier performance, and the learning of rotational classification invariance using feature vectors deliberately chosen to be highly sensitive to object rotation. Capabilities and limitations of this method of feature vector classification are discussed.
Paper Details
Date Published: 21 March 1989
PDF: 7 pages
Proc. SPIE 1004, Automated Inspection and High-Speed Vision Architectures II, (21 March 1989); doi: 10.1117/12.948976
Published in SPIE Proceedings Vol. 1004:
Automated Inspection and High-Speed Vision Architectures II
Michael J. W. Chen, Editor(s)
PDF: 7 pages
Proc. SPIE 1004, Automated Inspection and High-Speed Vision Architectures II, (21 March 1989); doi: 10.1117/12.948976
Show Author Affiliations
David J. Herold, University of New Hampshire (United States)
W.Thomas Miller, University of New Hampshire (United States)
W.Thomas Miller, University of New Hampshire (United States)
L.Gordon Kraft, University of New Hampshire (United States)
Filson H. Glanz, University of New Hampshire (United States)
Filson H. Glanz, University of New Hampshire (United States)
Published in SPIE Proceedings Vol. 1004:
Automated Inspection and High-Speed Vision Architectures II
Michael J. W. Chen, Editor(s)
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