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Proceedings Paper

Matricial Formalism For Interfacial Roughness Analysis Of LSMs
Author(s): B. Pardo; L. Nevot; J-M Andre
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Paper Abstract

The matricial formalism is adopted to treat the influence of the interfacial roughness. It is shown that the matrix characterizing the interface is modified in such a way that the Fresnel reflection coefficient is decreased and the Fresnel transmission coefficient is en-hanced by appropriate factors. These coefficients are formally similar to the so-called Debye-Waller factor, but they take account of the effective wavenumber of each medium. It results that a rough interface is in a way, equivalent to a homogeneous transition layer. Examples of characterization using measurements performed at 0.154 nm are given.

Paper Details

Date Published: 16 December 1988
PDF: 8 pages
Proc. SPIE 0984, X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, (16 December 1988); doi: 10.1117/12.948784
Show Author Affiliations
B. Pardo, Centre Universitaire (France)
L. Nevot, Centre Universitaire (France)
J-M Andre, CNRS (France)

Published in SPIE Proceedings Vol. 0984:
X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers
Finn Erland Christensen, Editor(s)

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