Proceedings Paper
Neutron reflectivity of Ni-Si multilayers| Format | Member Price | Non-Member Price |
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Paper Abstract
The neutron reflectivity spectra of multilayers has been measured as a function of angle of incidence and neutron wavelength in the range 1-7Å. The measurements are discussed in terms of the fabrication method employed and compared with the corresponding X-ray reflectivity spectra.
Paper Details
Date Published: 18 January 1989
PDF: 7 pages
Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); doi: 10.1117/12.948763
Published in SPIE Proceedings Vol. 0983:
Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides
Charles F. Majkrzak, Editor(s)
PDF: 7 pages
Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); doi: 10.1117/12.948763
Show Author Affiliations
J. B. Al-Dabbagh, University of Reading (United Kingdom)
B. L. Evans, University of Reading (United Kingdom)
Published in SPIE Proceedings Vol. 0983:
Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides
Charles F. Majkrzak, Editor(s)
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