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Proceedings Paper

A BRDF Measurement Apparatus For Cryogenically Cooled Samples
Author(s): R C Sullivan; B W Murray; S R Henion; G T Stribley
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Paper Abstract

A unique scatterometer and radiation facility has been developed to measure the BRDF at l0.6 μmt of mirror samples cooled to 20°K before and after electron beam irradiation. This paper will describe the facility and present some typical data.

Paper Details

Date Published: 5 April 1989
PDF: 6 pages
Proc. SPIE 0967, Stray Light and Contamination in Optical Systems, (5 April 1989); doi: 10.1117/12.948098
Show Author Affiliations
R C Sullivan, Spire Corporation (United States)
B W Murray, Spire Corporation (United States)
S R Henion, Spire Corporation (United States)
G T Stribley, Spire Corporation (United States)

Published in SPIE Proceedings Vol. 0967:
Stray Light and Contamination in Optical Systems
Robert P. Breault, Editor(s)

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