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Proceedings Paper

Misalignment Tolerances For A Phased Array Imaging System
Author(s): Eric W. Young; Shelah M. Peters
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Paper Abstract

A technique is presented for calculating the aberrations induced by misalignment of elements of a phased array imaging system. The misalignment-induced aberration function will be derived in terms of a set of five vectors representing small displacements from the aligned position of each element. This aberration function will represent changes in optical path along each ray for the displacement under consideration. Use of this aberration function can then be made to conduct parametric tolerance studies of such phased array systems. The behavior of the optical system can be analyzed for variable location of the image plane and at selected points within it. These studies are difficult to conduct with conventional ray trace programs, as they involve voluminous number crunching and great attention to proper selection of coordinate systems and transformations. We present results which illustrate the precision levels that should be met in the alignment and metrology of phased array imaging systems to be operated at visible wavelengths. These precision levels are challenging but achievable with state-of-the-art technology.

Paper Details

Date Published: 16 January 1989
PDF: 12 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947633
Show Author Affiliations
Eric W. Young, Optics and Applied Technology Laboratory (United States)
Shelah M. Peters, Optics and Applied Technology Laboratory (United States)

Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

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