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Proceedings Paper

Elastic Scattering Of Light From A Few Atomic Dipoles On A Flat Metal Surface
Author(s): Ole Keller; Peter Sonderkaer
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Paper Abstract

The integral-equation formalism previously used by the present authors to describe the elastic scattering of monochromatic light from a rough metal surface is reviewed. By taking the scattering of light from a plane metal surface as the zeroth order solution to the integral equation, the selvedge field and the diffusely scattered field outside the selvedge are determined in the first and second order Born approximation. On the basis of a generalized Huygens principle, the electromagnetic coupling between two source points located inside the selvedge is briefly discussed. Within the framework of the integral-equation approach, we consider the diffuse scattering of light from a few atoms outside a flat metal surface. By treating the light-induced radiation from an atom in the electric dipole approximation, a set of linear equations is established which allows us to determine the electric fields on the atomic sites, selfconsistently. In the case where only two atoms are placed outside the surface a detailed description of the interatomic coupling is given, and the exact solution for the selfconsistent field on the atomic sites is compared with that obtained in the second Born approximation. The contributions to the selfconsistent field from radiative and non-radiative modes, from self-field effects, and from the excitation of surface polaritons are investigated. With knowledge of the selfconsistent field on the dipole sites we examine the diffusely scattered field. We close our theoretical treatment by outlining how the present work can serve as an adequate starting point for elaborated studies of the diffuse scattering of light from small clusters of atoms on a perfectly flat metal surface. In the final chapter of our paper we present a number of numerical results for the case where one has two atoms outside the surface. Using dielectric data for aluminium a detailed analysis of the frequency dependence of the diffuse scattering process is undertaken.

Paper Details

Date Published: 16 January 1989
PDF: 22 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947610
Show Author Affiliations
Ole Keller, University of Aalborg (Denmark)
Peter Sonderkaer, University of Aalborg (Denmark)

Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

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