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Proceedings Paper

Moire Interferometry Applied To Topographic Contour Measurement
Author(s): Y. Z. Dai; F. P. Chiang
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Paper Abstract

Moire interferometry in this paper is extended to topographic contour measurement of an arbitrary object. The principle of the proposed method is different from that of projection moire and shadow moire methods in both the moire fringe forming mechanism and the w displacement evaluation. The advantage of the present method over the others is that it has a very high sensitivity which can be the order of Amm. As an experimental verification, the method is applied to the topographic contour measurement of a cylindrical shell with and without a diametric point loading.

Paper Details

Date Published: 16 January 1989
PDF: 7 pages
Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947584
Show Author Affiliations
Y. Z. Dai, State University of New York at Stony Brook (United States)
F. P. Chiang, State University of New York at Stony Brook (United States)

Published in SPIE Proceedings Vol. 0954:
Optical Testing and Metrology II
Chander Prakash Grover, Editor(s)

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