Share Email Print

Proceedings Paper

Photoluminescence Decay Time Studies of Type II GaAs/AlAs Quantum Well Structures
Author(s): P. Dawson; K. J. Moore; C. T. Foxon; G. W.'t Hooft; B. A. Wilson; C. E. Bonner
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We have investigated the temperatdre dependence of the photoluminescence (PL) decay kinetics of a series of GaAs/AlAs quantum well structures where the GaAs thickness was kept constant at 25Å and the AlAs was varied between 41Å and 19Å. In these structures the band alignment is type II and the dominant photoluminescence process at 4K is due to recombination of excitons involving electrons confined at the AlAs X point and holes in the GaAs. At 4K on the low energy side of the zero phonon type II transition the PL decay is a single exponential over at least two decades. The time constant of this decay is a strong function of the AlAs layer thickness. The variation of this decay time is in line with a change in oscillation strength of the type II process due to the change in the mixing between the Xz(AlAs) electron states and the Γ (GaAs) electron states. At higher temperatures (T>15K) the photoluminescence intensity and the decay time decrease very rapidly with increasing temperature. This is due to the increased influence of non-radiative proceses as the type II excitons become delocalised.

Paper Details

Date Published: 18 August 1988
PDF: 5 pages
Proc. SPIE 0943, Quantum Well and Superlattice Physics II, (18 August 1988); doi: 10.1117/12.947308
Show Author Affiliations
P. Dawson, Philips Research Laboratories (England)
K. J. Moore, Philips Research Laboratories (England)
C. T. Foxon, Philips Research Laboratories (England)
G. W.'t Hooft, Philips Research Laboratories (Netherlands)
B. A. Wilson, A.T and T. Bell Laboratories (United States)
C. E. Bonner, A.T and T. Bell Laboratories (United States)

Published in SPIE Proceedings Vol. 0943:
Quantum Well and Superlattice Physics II
Federico Capasso; Gottfried H. Doehler; Joel N. Schulman, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?