
Proceedings Paper
Ultrafast Electronic And Vibrational Effects In Amorphous MultilayersFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
We present a new, purely optical technique for time-of-flight experiments in the picosecond time range using a-Si:H/a-SiNx:H multilayers. We demonstrate the presence of vibrational surface modes in a-Ge:H/a-Si:H multilayers by measuring the acoustic response in real time.
Paper Details
Date Published: 22 August 1988
PDF: 7 pages
Proc. SPIE 0942, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II, (22 August 1988); doi: 10.1117/12.947211
Published in SPIE Proceedings Vol. 0942:
Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II
Robert R. Alfano, Editor(s)
PDF: 7 pages
Proc. SPIE 0942, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II, (22 August 1988); doi: 10.1117/12.947211
Show Author Affiliations
H. T. Grahn, Brown University (United States)
H. J. Maris, Brown University (United States)
J. Tauc, Brown University (United States)
H. J. Maris, Brown University (United States)
J. Tauc, Brown University (United States)
Z. Vardeny, University of Utah (United States)
B. Abeles, Exxon Research and Engineering Company (United States)
B. Abeles, Exxon Research and Engineering Company (United States)
Published in SPIE Proceedings Vol. 0942:
Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II
Robert R. Alfano, Editor(s)
© SPIE. Terms of Use
