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Proceedings Paper

Electron-Hole Interaction In GaAs
Author(s): M. A. Osman; H. L. Grubin
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Paper Abstract

The role of electron-hole interaction in the ultrafast relaxation of hot photoexcited carriers in GaAs and how it depends on the carrier density and energy of the laser pulse is discussed. The intervalley transfer of carriers photoexcited by a 2.04 laser pulse and their response to 500V/cm field is examined for two excitation levels of 5x1016 cm-3 and 1018 cm-3. It is found that the transfer rates are not affected by e-h or electron-electron interaction at low excitation levels. At high excitation levels the e-h interaction accelerates the return rates to the central valley and provides an important energy loss channel for the electrons. In response to a 500V/cm field, the electrons exhibit very small velocities during the first two picoseconds. At times beyond 4 ps, the velocities are smaller for higher electron densities.

Paper Details

Date Published: 22 August 1988
PDF: 14 pages
Proc. SPIE 0942, Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II, (22 August 1988); doi: 10.1117/12.947189
Show Author Affiliations
M. A. Osman, Scientific Research Associates (United States)
H. L. Grubin, Scientific Research Associates (United States)

Published in SPIE Proceedings Vol. 0942:
Ultrafast Laser Probe Phenomena in Bulk and Microstructure Semiconductors II
Robert R. Alfano, Editor(s)

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