Proceedings Paper
Surveillance Sensor Test Chamber: System Design Concepts Of Internal Calibrator And Of Calibration Sources| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
The internal calibration system of a newly designed surveillance sensor test chamber and a novel approach of generating a multitude of identical thermal point sources are described and discussed.
Paper Details
Date Published: 14 July 1988
PDF: 12 pages
Proc. SPIE 0940, Infrared Scene Simulation: Systems, Requirements, Calibration, Devices, and Modeling, (14 July 1988); doi: 10.1117/12.947139
Published in SPIE Proceedings Vol. 0940:
Infrared Scene Simulation: Systems, Requirements, Calibration, Devices, and Modeling
R. Barry Johnson; Milton J. Triplett, Editor(s)
PDF: 12 pages
Proc. SPIE 0940, Infrared Scene Simulation: Systems, Requirements, Calibration, Devices, and Modeling, (14 July 1988); doi: 10.1117/12.947139
Show Author Affiliations
Rudolf H. Meier, Rockwell International Corporation (United States)
Clyde A. Randolph, Rockwell International Corporation (United States)
Published in SPIE Proceedings Vol. 0940:
Infrared Scene Simulation: Systems, Requirements, Calibration, Devices, and Modeling
R. Barry Johnson; Milton J. Triplett, Editor(s)
© SPIE. Terms of Use
