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Proceedings Paper

Image Segmentation And Reflection Analysis Through Color
Author(s): Gudrun J. Klinker; Steven A. Shafer; Takeo Kanade
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Paper Abstract

In this paper, we present an approach to color image understanding that can be used to segment and analyze surfaces with color variations due to highlights and shading. We begin with a theory that relates the reflected light from dielectric materials, such as plastic, to fundamental physical reflection processes, and describes the color of the reflected light as a linear combination of the color of the light due to surface reflection (highlights) and body reflection (object color). This theory is used in an algorithm that separates a color image into two parts: an image of just the highlights, and the original image with the highlights removed. In the past, we have applied this method to hand-segmented images. The current paper shows how to perform automatic segmentation method by applying this theory in stages to identify the object and highlight colors. The result is a combination of segmentation and reflection analysis that is better than traditional heuristic segmentation methods (such as histogram thresholding), and provides important physical information about the surface geometry and material properties at the same time. We also show the importance of modeling the camera properties for this kind of quantitative analysis of color. This line of research cRn lead to physics-based image segmentation methods that are both more reliable and more useful than traditional segmentation methods.

Paper Details

Date Published: 29 March 1988
PDF: 16 pages
Proc. SPIE 0937, Applications of Artificial Intelligence VI, (29 March 1988); doi: 10.1117/12.946980
Show Author Affiliations
Gudrun J. Klinker, Carnegie-Mellon University (United States)
Steven A. Shafer, Carnegie-Mellon University (United States)
Takeo Kanade, Carnegie-Mellon University (United States)

Published in SPIE Proceedings Vol. 0937:
Applications of Artificial Intelligence VI
Mohan M. Trivedi, Editor(s)

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