Proceedings Paper
Relation Between Some Process Parameters And Properties Of Transition Metal-Rare Earth Films For Magneto-Optic Recording| Format | Member Price | Non-Member Price |
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Paper Abstract
Various relations are presented between a number of process variables and the resultant properties of transition metal-rare earth films. In particular the bias voltage, target voltage and argon gas pressure are related to the film coercivity, compensation temperature, anisotropy and film thickness. The domain size obtained on writing in these films with a laser is given as a function of write field, anisotropy, coercivity, film thick-ness, bias, and laser pulse width. Domains as small as 0.4 μm are reported. The trends observed are explained.
Paper Details
Date Published: 12 April 1985
PDF: 7 pages
Proc. SPIE 0529, Optical Mass Data Storage I, (12 April 1985); doi: 10.1117/12.946432
Published in SPIE Proceedings Vol. 0529:
Optical Mass Data Storage I
Robert A. Sprague, Editor(s)
PDF: 7 pages
Proc. SPIE 0529, Optical Mass Data Storage I, (12 April 1985); doi: 10.1117/12.946432
Show Author Affiliations
F. E. Luborsky, General Electric Corporate Research and Development (United States)
J. T. Furey, General Electric Corporate Research and Development (United States)
J. T. Furey, General Electric Corporate Research and Development (United States)
R. E. Skoda, General Electric Corporate Research and Development (United States)
B. C. Wagner, General Electric Corporate Research and Development (United States)
B. C. Wagner, General Electric Corporate Research and Development (United States)
Published in SPIE Proceedings Vol. 0529:
Optical Mass Data Storage I
Robert A. Sprague, Editor(s)
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