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Proceedings Paper

Design Of A Sample Chamber For Spatial Emissivity Measurements Using Thermal Imaging
Author(s): F. J. J. Clarke; N. A. Boyd; J. K. Leonard
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Paper Abstract

Optical and electronic modifications have been made to a TICM II thermal imager by NPL to allow its use in near-focus radiometric measurements. A GEMS image processing system has customised enhancements to the existing GEMMA sofware permitting pixel-by-pixel restoration and radiometric calibration of images with user-defined algorithms. To allow emissivity measurements to be made at near-ambient temperatures, a non-reflecting cryogenic sample chamber is necessary to remove the reflected component of sample radiance. The design and construction of such a sample chamber is discussed in detail in relation to the NPL facility nearing completion for measuring the emissivity of non-uniform materials or objects. Particular features are the avoidance of vacuum systems for purging or insulation, and the geometrical and thermal design to give ease of handling and a long operating period from a single filling with liquid nitrogen.

Paper Details

Date Published: 11 October 1988
PDF: 8 pages
Proc. SPIE 0916, Infrared Systems--Design and Testing, (11 October 1988); doi: 10.1117/12.945564
Show Author Affiliations
F. J. J. Clarke, National Physical Laboratory (England)
N. A. Boyd, National Physical Laboratory (England)
J. K. Leonard, National Physical Laboratory (England)

Published in SPIE Proceedings Vol. 0916:
Infrared Systems--Design and Testing
Peter R. Hall; John S. Seeley, Editor(s)

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