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Proceedings Paper

The Use Of Multilayer Diffraction Gratings In The Determination Of X-Ray, Soft X-Ray, And Vuv Elemental Scattering Cross-Sections
Author(s): Troy W Barbee Jr.
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Paper Abstract

The dispersion of light by multilayer combined microstructure diffraction gratings is affected by the scattering cross-sections of the elements used to synthesize the multilayer. This effect will be analytically evaluated, and the results of model calculations for spectral regions of interest presented. Experimental results for these domains will also be presented and compared with data from the literature and with the results of modelling calculations.

Paper Details

Date Published: 11 July 1988
PDF: 8 pages
Proc. SPIE 0911, X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements, (11 July 1988); doi: 10.1117/12.945490
Show Author Affiliations
Troy W Barbee Jr., Lawrence Livermore National Laboratory (United States)

Published in SPIE Proceedings Vol. 0911:
X-Ray and Vacuum Ultraviolet Interaction Data Bases, Calculations, and Measurements
Nancy DelGrande; James A. R. Samson; David Y. Smith, Editor(s)

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