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Proceedings Paper

A New Cad Technique For (Narrow Band) Inhomogeneous Thin Film Filters
Author(s): E. Berkcan; G. H. Cohen
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Paper Abstract

A new CAD technique based on the direct method of calculus of variations is developed for the design of (narrow band) inhomogeneous thin films. The control of the index of refraction n(.) is incorporated into the optimization method and in addition n(.) satisfies inequality constraints nmin ≤ n(.) ≤ nmax imposed by technical and physical requirements.

Paper Details

Date Published: 29 January 1985
PDF: 8 pages
Proc. SPIE 0518, Optical Systems Engineering IV, (29 January 1985); doi: 10.1117/12.945184
Show Author Affiliations
E. Berkcan, University of Rochester (United States)
G. H. Cohen, University of Rochester (United States)

Published in SPIE Proceedings Vol. 0518:
Optical Systems Engineering IV
Paul R. Yoder Jr., Editor(s)

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