Share Email Print
cover

Proceedings Paper

Statistical Effects In The Measurement And Characterization Of Smooth Scattering Surfaces
Author(s): E. L. Church
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Nature obliges us to use a statistical description of the scattering of light from randomly-rough surfaces. This paper discusses the role of statistical models and fluctuation phenomena in the measurement and characterization of such surfaces using area and profiling techniques.

Paper Details

Date Published: 17 January 1985
PDF: 6 pages
Proc. SPIE 0511, Stray Radiation IV, (17 January 1985); doi: 10.1117/12.945030
Show Author Affiliations
E. L. Church, US Army Armament Research and Development Center (United States)


Published in SPIE Proceedings Vol. 0511:
Stray Radiation IV
Robert P. Breault, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray