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Proceedings Paper

Test Station For Thin Film Electroluminescent (TFEL) Edge Emitter Array, A Potential Low-Cost, All Solid State Imaging Device
Author(s): Zoltan K Kun; David Leksell; Juris A Asars; Norman J Phillips
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Paper Abstract

A test station was developed to evaluate the TFEL edge emitter array in various imaging applications. It consists of 400-dpi and 20-dpi resolution edge emitter array test samples, a sample mount that accepts both kinds of edge emitters, and an electronic drive system. The drive system provides variable drive frequency and excitation voltage, internal test patterns, and an option for external data input. As an example of its capabilities, electrophotographic printing samples are shown.

Paper Details

Date Published: 24 June 1988
PDF: 10 pages
Proc. SPIE 0901, Image Processing, Analysis, Measurement, and Quality, (24 June 1988); doi: 10.1117/12.944701
Show Author Affiliations
Zoltan K Kun, Westinghouse R&D Center (United States)
David Leksell, Westinghouse R&D Center (United States)
Juris A Asars, Westinghouse R&D Center (United States)
Norman J Phillips, Westinghouse R&D Center (United States)

Published in SPIE Proceedings Vol. 0901:
Image Processing, Analysis, Measurement, and Quality
Gary W. Hughes; Patrick E. Mantey; Bernice E. Rogowitz, Editor(s)

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