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Proceedings Paper

An Expedient Approach To Focal Plane Testing
Author(s): R. A. Chandos; P. A. Howes; J. J. Knight; W. J. Parrish
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Paper Abstract

A low cost focal plane array test set was developed using a small micro-computer system controller. By careful selection of test types, hardware/software programability trade-offs and good software design the set performance has compared well to much larger test systems. An additional benefit of small size was noted--system noise levels were very low, enabling acquisition of high quality low level signal and noise data.

Paper Details

Date Published: 8 November 1984
PDF: 23 pages
Proc. SPIE 0501, State-of-the-Art Imaging Arrays and Their Applications, (8 November 1984); doi: 10.1117/12.944662
Show Author Affiliations
R. A. Chandos, Amber Engineering (United States)
P. A. Howes, Amber Engineering (United States)
J. J. Knight, Amber Engineering (United States)
W. J. Parrish, Amber Engineering (United States)

Published in SPIE Proceedings Vol. 0501:
State-of-the-Art Imaging Arrays and Their Applications
Keith N. Prettyjohns, Editor(s)

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