The number of bit errors in magneto-optical disks were reduced and a bit-error rate of 10-6 was achieved even after an accelerated lifetime test. To reduce the number of bit errors, we performed error detection and classification and found that the substrate was the dominant cause of errors. The substrate we used was a photopolymer(2P)-glass substrate, and we found two types of defect origin. One of them was due to 2P residues on the stamper, and the other was due to dust adhering to the substrate. We reduced the initial bit-error rate by removing these defects. We also found that 2P impurities considerably increase the bit-error rate during the accelerated lifetime test. By purifying the 2P, we made our disks more stable, and estimated that their lifetime would exceed 20 years at 40°C and 90% RH.

Date Published: 2 June 1988
PDF: 5 pages
Proc. SPIE 0899, Optical Storage Technology and Applications, (2 June 1988); doi: 10.1117/12.944609

Published in SPIE Proceedings Vol. 0899:
Optical Storage Technology and Applications
Donald B. Carlin; Albert A. Jamberdino; Yoshito Tsunoda, Editor(s)