
Proceedings Paper
A 100 Mhz Fiber Optic Single Transient Gamma Ray Detection SystemFormat | Member Price | Non-Member Price |
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Paper Abstract
A fiber optic system has been developed to measure single transient gamma rays. The gamma ray signature is converted to light by the Cerenkov process in a 20 cm length of radiation resistant optical fiber. The signal is transmitted over 1 km of optical fiber and detected by state-of-the-art, 175 MHz analog receivers. The receivers are based on silicon PIN detectors with transimpedance hybrid amplifiers and two stages of power amplification. The dc coupled receivers have less than 2% distortion up to 5 volts with less than 10 mV rms noise and a responsivity of 37,500 V/watt at 800 nm. A calibration system measures relative fiber to fiber transit time delays and "system" sensitivity. System bandwidth measurements utilized an electron linear accelerator (Linac) with a 50 ps electron pulse as the Cerenkov light source. The system will be described with supporting calibration and characterization data of parts of the system and the whole system.
Paper Details
Date Published: 26 December 1984
PDF: 7 pages
Proc. SPIE 0500, Fiber Optics: Short-Haul and Long-Haul Measurements and Applications II, (26 December 1984); doi: 10.1117/12.944595
Published in SPIE Proceedings Vol. 0500:
Fiber Optics: Short-Haul and Long-Haul Measurements and Applications II
Robert L. Galawa, Editor(s)
PDF: 7 pages
Proc. SPIE 0500, Fiber Optics: Short-Haul and Long-Haul Measurements and Applications II, (26 December 1984); doi: 10.1117/12.944595
Show Author Affiliations
J. W. Ogle, Los Alamos National Laboratory (United States)
R. C. Smith, Los Alamos National Laboratory (United States)
M. Ward, EG&G, Inc (United States)
R. C. Smith, Los Alamos National Laboratory (United States)
M. Ward, EG&G, Inc (United States)
R. Ramsey, EG&G, Inc (United States)
J. Hollabaugh, EG&G, Inc (United States)
J. Hollabaugh, EG&G, Inc (United States)
Published in SPIE Proceedings Vol. 0500:
Fiber Optics: Short-Haul and Long-Haul Measurements and Applications II
Robert L. Galawa, Editor(s)
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