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Proceedings Paper

Constraint on the optical constants of bilayer film-substrate external-reflection retarders for given substrates and incidence angle
Author(s): B. E. Perilloux
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Paper Abstract

Given two transparent films of refractive index n1 and n2 on a given arbitrarily absorbing substrate of complex refractive index N3 = n3-jk3, at a given oblique angle of incidence 0, solution sets for the film indices n1 and n2 are determined where the bilayer film-substrate external-reflection retarder system achieves a specified differential phase shift Δ and has equal p and s polarization reflectances where Rp = Rs. n1, n2 solution sets are presented in graphical form as solution zones in the n1, n2 plane for 0 = 45°, and Δ = ±90° and ±180°, corresponding to quarterwave and halfwave retarders (QWR and HWR), respectively. These n1, n2 solution sets are specifically found for two commonly utilized substrate materials in the visible and infrared wavelength regions, namely, fused silica and silver, respectively. Values of the normalized film thicknesses 1 and 2 , and the polarization-independent reflectance are separately inserted at various internal and boundary solution points, in the n1, n2 solution zones, on the n1, n2 graphs. For each n1, n2 solution set, there are two sets of film thicknesses r 1a' 2a and r 1b' 2b that allow equal p and s polarization reflectances and the specified differential phase shift A. For fused silica (where k3 = 0) and = ± 180°, the two sets of normalized film thicknesses satisfy the relationships 1, 2a c2b = 1 and gz(r 1 a, for each n1,n2 solution set.

Paper Details

Date Published: 29 June 1988
PDF: 13 pages
Proc. SPIE 0891, Polarization Considerations for Optical Systems, (29 June 1988); doi: 10.1117/12.944314
Show Author Affiliations
B. E. Perilloux, Coherent, Inc. (United States)

Published in SPIE Proceedings Vol. 0891:
Polarization Considerations for Optical Systems
Russell A. Chipman, Editor(s)

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