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Proceedings Paper

Growth And Characterization Of CdxHgl-xTte For Optical Communications
Author(s): A Lusson; R Legros; Y Marfaing; R Triboulet; A Tromson-Carli
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Paper Abstract

CdxHg1_xTe layers have been grown by Liquid Phase Epitaxy in a wide composition range (0.5 < x < 1), covering the alloys adapted to detection at the optical communication wave-lengths (1.3 - 2.5 μm). Layers of thickness ranging from 2 to 20 μm and with high structural quality and composition uniformity are obtained thanks to a new determination of the phase diagram. Electrical measurements and exciton photoluminescence spectra confirm the general improvement reached for LPE layers compared to bulk crystals.

Paper Details

Date Published: 1 January 1987
PDF: 4 pages
Proc. SPIE 0866, Materials and Technologies for Optical Communications, (1 January 1987); doi: 10.1117/12.943587
Show Author Affiliations
A Lusson, CNRS (France)
R Legros, CNRS (France)
Y Marfaing, CNRS (France)
R Triboulet, CNRS (France)
A Tromson-Carli, CNRS (France)

Published in SPIE Proceedings Vol. 0866:
Materials and Technologies for Optical Communications
Alain P. Brenac, Editor(s)

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