Proceedings Paper
Photographic Speckle Pattern Interferometry: An Analysis Of Its Fourier Components And Their Application To Electronic Speckle Pattern Interferometry (ESPI).| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
The present paper introduces a double exposure photographic technique that displays, on a single film frame, speckle (addition) correlation fringes identical to those obtained (on substraction) with ESPI. This double exposed photograph is later spatially Fourier filtered to elminate the optical noise giving, as a result, an image of holographic quality. The information given by the Fourier spatial spectrum of the deformed object is at present being studied with the aim of introducing an electronic filter into ESPI. A theoretical account of the above process is given.
Paper Details
Date Published: 1 June 1988
PDF: 6 pages
Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943498
Published in SPIE Proceedings Vol. 0863:
Industrial Optoelectronic Measurement Systems Using Coherent Light
William F. Fagan, Editor(s)
PDF: 6 pages
Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943498
Show Author Affiliations
F.Mendoza Santoyo, Loughborough University of Technology (England)
B. D. Bergquist, Loughborough University of Technology (England)
Published in SPIE Proceedings Vol. 0863:
Industrial Optoelectronic Measurement Systems Using Coherent Light
William F. Fagan, Editor(s)
© SPIE. Terms of Use
