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Proceedings Paper

CCD Application For Interferometric Fringe Analysis Of Eroded Surface
Author(s): C. Pieralli; C. Tribilion; R. Devillers; Y. Cuerveno
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Paper Abstract

An optical heterodyne profilometer has been develooped to get parameters of profiles such as roughness, skewness... Now, it is associated with image processings for automated pattern recognition. Their applications, either on calculated profiles or interference patterns, yield to characteristics of defects on a surface. This device can be a useful tool for the study of erosion phenomena.

Paper Details

Date Published: 1 June 1988
PDF: 5 pages
Proc. SPIE 0863, Industrial Optoelectronic Measurement Systems Using Coherent Light, (1 June 1988); doi: 10.1117/12.943491
Show Author Affiliations
C. Pieralli, UFR Sciences et Techniques (France)
C. Tribilion, UFR Sciences et Techniques (France)
R. Devillers, UFR Sciences et Techniques (France)
Y. Cuerveno, UFR Sciences et Techniques (France)

Published in SPIE Proceedings Vol. 0863:
Industrial Optoelectronic Measurement Systems Using Coherent Light
William F. Fagan, Editor(s)

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