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Proceedings Paper

Advanced Map For Real-Time Process Control
Author(s): Yasuhisa Shiobara; Takayuki Matsudaira; Yoshio Sashida; Makoto Chikuma
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Paper Abstract

MAP, a communications protocol for factory automation proposed by General Motors [1], has been accepted by users throughout the world and is rapidly becoming a user standard. In fact, it is now a LAN standard for factory automation. MAP is intended to interconnect different devices, such as computers and programmable devices, made by different manufacturers, enabling them to exchange information. It is based on the OSI intercomputer com-munications protocol standard under development by the ISO. With progress and standardization, MAP is being investigated for application to process control fields other than factory automation [2]. The transmission response time of the network system and centralized management of data exchanged with various devices for distributed control are import-ant in the case of a real-time process control with programmable controllers, computers, and instruments connected to a LAN system. MAP/EPA and MINI MAP aim at reduced overhead in protocol processing and enhanced transmission response. If applied to real-time process control, a protocol based on point-to-point and request-response transactions limits throughput and transmission response. This paper describes an advanced MAP LAN system applied to real-time process control by adding a new data transmission control that performs multicasting communication voluntarily and periodically in the priority order of data to be exchanged.

Paper Details

Date Published: 19 October 1987
PDF: 9 pages
Proc. SPIE 0857, IECON'87:Automated Design and Manufacturing, (19 October 1987); doi: 10.1117/12.943275
Show Author Affiliations
Yasuhisa Shiobara, Toshiba Corporation (Japan)
Takayuki Matsudaira, Toshiba Corporation (Japan)
Yoshio Sashida, Toshiba Corporation (Japan)
Makoto Chikuma, Toshiba Corporation (Japan)

Published in SPIE Proceedings Vol. 0857:
IECON'87:Automated Design and Manufacturing
Victor K.L. Huang, Editor(s)

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