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Proceedings Paper

High-Speed Pattern Recognition System Based On A Template Matching
Author(s): Yutaka Ishizaka; Shoji Shimomura
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Paper Abstract

This paper introduces a pattern recognition system based on a template matching method in industrial applications. The system can inspect various objects, after correcting the orientation. The processing time is less than 80 ms, which includes determining of the orientation of those objects, correcting of the orientation, and the template matching. It is almost the same as or less than that of the other systems which allow no rotation. In order to correct the orientation at high speed, following three techniques have been developed. Firstly, a high speed affine transformation circuit executes rotation operation in less than 8 ms for a 256 x 256 image. Secondly, other special circuits extract some features of a binary image to determine the orientation of object. Thirdly, the local-scan hardware applied to the first and second circuits scan the effective area at the scanning rate of 8 MHz. The system has three algorithms of determining the orientation. It is determined by means of the direction of the principal axis of inertia, the binary image along a circumference, and a pair of straight lines. These algorithms are selectable according to the objects. The orientation is determined with the accuracy better than +0.5 degree.

Paper Details

Date Published: 22 March 1988
PDF: 7 pages
Proc. SPIE 0849, Automated Inspection and High-Speed Vision Architectures, (22 March 1988); doi: 10.1117/12.942843
Show Author Affiliations
Yutaka Ishizaka, Fuji Electric Corporate Research and Development Ltd. (Japan)
Shoji Shimomura, Fuji Electric Corporate Research and Development Ltd. (Japan)

Published in SPIE Proceedings Vol. 0849:
Automated Inspection and High-Speed Vision Architectures
Rolf-Juergen Ahlers; Michael J. W. Chen, Editor(s)

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