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Proceedings Paper

Tunable Model-Driven Nonuniform Sampling Methods For 3-D Inspection
Author(s): Charles B. Malloch; William I. Kwak; Lester A. Gerhardt
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Paper Abstract

The development of a CIM (Computer Integrated Manufacturing) environment requires that inspection processes be linked to databases containing the design data. Increased emphasis on flexibility must not be bought at the expense of increased human involvement in producing process directives. The RPI CIM program has developed an automated 3-D inspection system which integrates a CAD database to develop preliminary inspection directives. The design of the inspection system is characterized by real-time operation, an ability to utilize 3-D data originating from both a CAD model and from points on a test piece, the automatic generation of inspection programs based on model features, and the system's sensitivity to tolerancing issues. Inspection of manufactured parts and assemblies often requires large amounts of information in the form of test probe point locations and large amounts of time to perform the inspection. By optimally locating the probe points it is possible to maintain inspection reliability using fewer test probes in a reduced amount of time. A class of sampling schemes has been developed which use part model and manufacturing process information to generate an improved probe-point location set for routine inspection in a model-based, open-loop mode. The objective of the proposed sampling scheme is to optimize the placement of the sample points on the ideal model to minimize the chance of missing a discrepancy. The algorithm which generates the inspection program bases its test-point placement on an estimate of the likelihood of a machining discrepancy at any given point on the part surface. Implemented for evaluation in 2-D, the algorithm has been selected for its ability to be extended to 3-D. Test results show that it performs favorably on a large class of surfaces.

Paper Details

Date Published: 22 March 1988
PDF: 10 pages
Proc. SPIE 0849, Automated Inspection and High-Speed Vision Architectures, (22 March 1988); doi: 10.1117/12.942833
Show Author Affiliations
Charles B. Malloch, Rensselaer Polytechnic Institute (United States)
William I. Kwak, Rensselaer Polytechnic Institute (United States)
Lester A. Gerhardt, Rensselaer Polytechnic Institute (United States)

Published in SPIE Proceedings Vol. 0849:
Automated Inspection and High-Speed Vision Architectures
Rolf-Juergen Ahlers; Michael J. W. Chen, Editor(s)

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