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Proceedings Paper

Review Of Ultraviolet Damage Threshold Measurements At Lawrence Livermore National Laboratory
Author(s): W.Howard Lowdermilk; David Milam
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Paper Abstract

The results of damage threshold measurements made at LLNL using ultraviolet wavelength laser pulses are reviewed. Measurements were made with pulses from a krypton fluoride laser with wavelength of 248 nm and pulse duration of 20 ns and with Nd-glass laser pulses converted to the third harmonic wavelength of 355 nm with duration of 0.6 ns. Measurements are presented for transparent window materials, crystals for harmonic generation, single layer dielectric films of oxide and fluoride materials and multilayer high reflectivity and antireflective coatings.

Paper Details

Date Published: 15 August 1984
PDF: 20 pages
Proc. SPIE 0476, Excimer Lasers: Their Applications & New Frontiers in Lasers, (15 August 1984); doi: 10.1117/12.942584
Show Author Affiliations
W.Howard Lowdermilk, Lawrence Livermore National Laboratory (United States)
David Milam, Lawrence Livermore National Laboratory (United States)

Published in SPIE Proceedings Vol. 0476:
Excimer Lasers: Their Applications & New Frontiers in Lasers
Ronald W. Waynant, Editor(s)

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