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Proceedings Paper

Use Of Stimulated Raman Scattering For Reducing The Divergence Of Severely Aberrated Laser Beams
Author(s): Robert S. F. Chang; Michael T. Duignan; Robert H. Lehmberg; Nicholas Djeu
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Paper Abstract

Amplification of a diffraction-limited Stokes beam in a hydrogen Raman amplifier pumped by a severely aberrated XeC1 laser has been studied experimentally. Spatial quality of the amplified Stokes beam and conversion efficiency from the pump laser were measured. Numerical study of this process using a two-dimensional propagation code that includes pump depletion was performed. The simulation shows that the quality of the amplified Stokes beam depends critically on the absence of any near-axial components in the pump laser. These components of the pump can cause phase matched four-wave mixing interactions with the Stokes, leading to increased angular divergence of the amplified Stokes beam and the development of secondary sidebands in the far field. An optical integrator was used to focus the poor quality pump beam into the amplifier and to remove all near-axial components in the pump field. The diffraction-limited nature of the input Stokes beam was then preserved in the amplified Stokes beam. A power conversion from the aberrated pump to the Stokes beam of the order of 30% was observed. The far field intensity of the Stokes beam increased by a factor of 5000 over that of the original pump.

Paper Details

Date Published: 15 August 1984
PDF: 11 pages
Proc. SPIE 0476, Excimer Lasers: Their Applications & New Frontiers in Lasers, (15 August 1984); doi: 10.1117/12.942577
Show Author Affiliations
Robert S. F. Chang, Naval Research Laboratory (United States)
Michael T. Duignan, Naval Research Laboratory and Sachs-Freeman Associates, Inc. (United States)
Robert H. Lehmberg, Naval Research Laboratory (United States)
Nicholas Djeu, Naval Research Laboratory and University of South Florida (United States)

Published in SPIE Proceedings Vol. 0476:
Excimer Lasers: Their Applications & New Frontiers in Lasers
Ronald W. Waynant, Editor(s)

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