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Proceedings Paper

Thermal Stability Of LiNbO[sub]3[/sub] Electro-Optic Waveguide Modulators For Remote Voltage Sensing
Author(s): C. Duchet; P. Fabre; M. Di Maggio
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Paper Abstract

The thermal instability of the working point of integrated devices may arise from photoelastic effect. MACH-ZEHNDER interferometer with special electrode structure, previously designed to have a high voltage sensitivity, leads also to a good thermal stability.

Paper Details

Date Published: 23 March 1988
PDF: 7 pages
Proc. SPIE 0838, Fiber Optic and Laser Sensors V, (23 March 1988); doi: 10.1117/12.942487
Show Author Affiliations
C. Duchet, CGE Research Center (France)
P. Fabre, CGE Research Center (France)
M. Di Maggio, CGE Research Center (France)

Published in SPIE Proceedings Vol. 0838:
Fiber Optic and Laser Sensors V
Ramon P. DePaula; Eric Udd, Editor(s)

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