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Proceedings Paper

Application Of Laser Interferometry For The Determination Of Optical Path Changes Of Reflecting Optical Systems
Author(s): Jiri Krsek
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Paper Abstract

Increased demands on geometrical accuracy and adjustment of optical elements and systems used in the laser measuring technique brought about development of new interference testing methods. The interference principle of determining optical path changes of the reflecting optical system enables the direct determination of changes of the functional arrangement of the measured optical system. The described interference methods are used for testing straightness and orthogonality of the coordinate axes of the reflecting optical system for a two-coordinate interferometer.

Paper Details

Date Published: 18 January 1985
PDF: 4 pages
Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); doi: 10.1117/12.942405
Show Author Affiliations
Jiri Krsek, Institute of Scientific Instruments of the Czechoslovak Academy of Sciences (Czechoslovakia)

Published in SPIE Proceedings Vol. 0473:
Symposium Optika '84
Gabor Lupkovics; Andras Podmaniczky, Editor(s)

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