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Proceedings Paper

Characterization Of Frequency Dispersion In Ti-Indiffused Lithium Niobate Optical Devices
Author(s): J. L. Nightingale; R. A. Becker; P. C. Willis; J. S. Vrhel
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Paper Abstract

The frequency dispersion of integrated optic interferometers fabricated on different lithium niobate cuts is characterized. Only the configuration that uses the r33 electrooptic coefficient is well behaved.

Paper Details

Date Published: 10 March 1988
PDF: 5 pages
Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); doi: 10.1117/12.942339
Show Author Affiliations
J. L. Nightingale, Crystal Technology Inc. (United States)
R. A. Becker, Crystal Technology Inc. (United States)
P. C. Willis, Crystal Technology Inc. (United States)
J. S. Vrhel, Crystal Technology Inc. (United States)

Published in SPIE Proceedings Vol. 0835:
Integrated Optical Circuit Engineering V
Mark A. Mentzer, Editor(s)

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