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Proceedings Paper

Surface Correlation Function Analysis Of High Resolution Scattering Data From Mirrored Surfaces Obtained Using A Triple-Axis X-Ray Diffractometer
Author(s): Finn E. Christensen; A. Hornstrup; Herbert W. Schnopper
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Paper Abstract

Within various x-ray programs there exists a need for a detailed investigation of the surface roughness of mirrored surfaces over a wide spatial wavelength bandwidth, ranging from large scale figure error to microroughness. A number of methods exist to measure the surface roughness. Common to all methods is that they are bandwidth-limited. A crucial point in the analysis of data is, therefore, to specify accurately the wavelength bandwidth limitation and to determine the surface autocorrelation function within this band-width. We present a number of scattering measurements obtained using a triple-axis perfect-crystal x-ray diffractometer and the results of an autocorrelation function analysis. Furthermore, we present some measurements of integrated reflectivity, which we believe provide evidence for microroughness in the range from a few angstroms to tens of microns.

Paper Details

Date Published: 9 August 1988
PDF: 10 pages
Proc. SPIE 0830, Grazing Incidence Optics for Astronomical and Laboratory Applications, (9 August 1988); doi: 10.1117/12.942161
Show Author Affiliations
Finn E. Christensen, Danish Space Research Institute (Denmark)
A. Hornstrup, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Danish Space Research Institute (Denmark)

Published in SPIE Proceedings Vol. 0830:
Grazing Incidence Optics for Astronomical and Laboratory Applications
C. Stuart Bowyer, Editor(s)

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