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Proceedings Paper

The Application Of Phase Stepping To The Analysis Of ESPI Fringe Patterns
Author(s): D. Kerr; J. R. Tyrer
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Paper Abstract

A detailed investigation has been carried out into the application of digital phase stepping techniques in the computer analysis of Electronic Speckle Pattern Interferometry fringe data. The entire analysis process has been examined from its initial stages of video resolution and digitisation, through to the representation of phase data within a computer matrix for subsequent data analysis. These investigations have utilised standard video analysis equipment as well as specialised analogue and digital devices designed and built in-house. A high resolution, real time digital image processing system has been used in the analysis of the fringe data, for which specific applications software has been designed. A brief description of some of these devices is included, together with the details of their design philosophy and practical application. Each stage of the analysis method has been evaluated from a signal or image processing viewpoint and optimised to give the best results from a phase representation approach. The resulting processing method is described and example images are used to illustrate successive stages.

Paper Details

Date Published: 17 February 1987
PDF: 11 pages
Proc. SPIE 0814, Photomechanics and Speckle Metrology, (17 February 1987); doi: 10.1117/12.941723
Show Author Affiliations
D. Kerr, Loughborough University of Technology (England)
J. R. Tyrer, Loughborough University of Technology (England)

Published in SPIE Proceedings Vol. 0814:
Photomechanics and Speckle Metrology
Fu-Pen Chiang, Editor(s)

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