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Proceedings Paper

A Computer Based Moire Technique To Measure Very Small Displacements
Author(s): Cesar A. Sciammarella; Mansour A. Amadshahi; B. Subbaraman
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Paper Abstract

The accuracy that can be achieved in the measurement of very small displacements in techniques such as moire, holography and speckle is limited by the noise inherent to the utilized optical devices. To reduce the noise to signal ratio, the moire method can be utilized. Two system of carrier fringes are introduced, an initial system before the load is applied and a final system when the load is applied. The moire pattern of these two systems contains the sought displacement information and the noise common to the two patterns is eliminated. The whole process is performed by a computer on digitized versions of the patterns. Examples of application are given.

Paper Details

Date Published: 17 February 1987
PDF: 7 pages
Proc. SPIE 0814, Photomechanics and Speckle Metrology, (17 February 1987); doi: 10.1117/12.941706
Show Author Affiliations
Cesar A. Sciammarella, Illinois Institute of Technology (United States)
Mansour A. Amadshahi, Illinois Institute of Technology (United States)
B. Subbaraman, Illinois Institute of Technology (United States)

Published in SPIE Proceedings Vol. 0814:
Photomechanics and Speckle Metrology
Fu-Pen Chiang, Editor(s)

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