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Proceedings Paper

Hemispherical Directional Ellipsoidal Infrared Spectro Reflectometer
Author(s): John T. Neu; Richard S. Dummer; Orlo E. Myers
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Paper Abstract

There are specialized requirements for surface optical properties in a variety of fields. Activities in space especially have stimulated interest in these properties and led to development of refined instrumentation. One of the most commonly required optical properties is directional reflectance. The design and performance of a hemi-ellipsoidal spectroreflectometer to measure this property is the subject of this paper.

Paper Details

Date Published: 10 September 1987
PDF: 11 pages
Proc. SPIE 0807, Passive Infrared Systems and Technology, (10 September 1987); doi: 10.1117/12.941453
Show Author Affiliations
John T. Neu, Surface Optics Corporation (United States)
Richard S. Dummer, Surface Optics Corporation (United States)
Orlo E. Myers, Surface Optics Corporation (United States)

Published in SPIE Proceedings Vol. 0807:
Passive Infrared Systems and Technology
H. M. Lamberton, Editor(s)

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