Proceedings Paper
Measurement Of Surface Profile Changes By The Use Of Moire Fringes With Particular Application To Mass Transfer| Format | Member Price | Non-Member Price |
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Paper Abstract
The use of Moire fringes for the measurement of mass transfer is reported. In this application, changes in surface profile on a naphthalene plate due to mass transfer take place. The profile changes are measured using Moire fringes and the results are compared with an existing measuring device which uses a height sensitive stylus. Fringe patterns are illustrated on both flat and cylindrical surfaces.
Paper Details
Date Published: 28 September 1987
PDF: 8 pages
Proc. SPIE 0805, Optical Components and Systems, (28 September 1987); doi: 10.1117/12.941381
Published in SPIE Proceedings Vol. 0805:
Optical Components and Systems
Andre Masson, Editor(s)
PDF: 8 pages
Proc. SPIE 0805, Optical Components and Systems, (28 September 1987); doi: 10.1117/12.941381
Show Author Affiliations
Monica Flanagan, Coventry Lanchester Polytechnic (U.K.)
Dennis Wilcock, Coventry Lanchester Polytechnic (U.K.)
Dennis Wilcock, Coventry Lanchester Polytechnic (U.K.)
Catherine Wykes, University of Nottingham (U.K.)
Published in SPIE Proceedings Vol. 0805:
Optical Components and Systems
Andre Masson, Editor(s)
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