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Proceedings Paper

Picosecond Resolution Sampling Via Multiphoton Photoemission
Author(s): A. M. Weiner; P. S.D. Lin; R. B. Marcus
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Paper Abstract

Photoemissive sampling was recently introduced as a new, contactless method for probing picosecond electrical waveforms on any semiconductor. In our experiments, femtosecond optical pulses from a visible laser stimulate multiphoton photoelectron emission from metal lines on the surface of the device under test. The potential at the emitting surface is derived from energy analysis of the photoelectrons. We have investigated experimentally the temporal resolution of photoemissive sampling by performing sampling measurements of picosecond electrical transients propagating on transmission line structures on gallium arsenide. Photoemissive sampling measurements of picosecond electrical steps generated photoconductively on a 5-μm gold coplanar transmission line demonstrate a temporal resolution of 5-psec, with a voltage sensitivity of 10 mV/Hz.

Paper Details

Date Published: 2 February 1988
PDF: 8 pages
Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); doi: 10.1117/12.940950
Show Author Affiliations
A. M. Weiner, Bell Communications Research (United States)
P. S.D. Lin, Bell Communications Research (United States)
R. B. Marcus, Bell Communications Research (United States)

Published in SPIE Proceedings Vol. 0795:
Characterization of Very High Speed Semiconductor Devices and Integrated Circuits
Ravinder K. Jain, Editor(s)

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