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Proceedings Paper

Photoemissive Probing Of High-Speed Signals
Author(s): A. M. Weiner; P. S. D. Lin; R. B. Marcus; J. Orloff
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Paper Abstract

High-speed electrical signals on any semiconductor device or circuit are probed by generation of short (80 fs) pulses of photoelectrons at the point of measurement; and performing an energy analysis of the emitted electrons. A temporal resolution of 5.3 ps has been achieved on a photoconductive signal generated on a 5 μm co-planar strip line.

Paper Details

Date Published: 1 September 1987
PDF: 4 pages
Proc. SPIE 0774, Lasers in Microlithography, (1 September 1987); doi: 10.1117/12.940390
Show Author Affiliations
A. M. Weiner, Bell Communications Research, Inc. (United States)
P. S. D. Lin, Bell Communications Research, Inc. (United States)
R. B. Marcus, Bell Communications Research, Inc. (United States)
J. Orloff, Oregon Graduate Center (United States)

Published in SPIE Proceedings Vol. 0774:
Lasers in Microlithography
John Samuel Batchelder; Daniel J. Ehrlich; Jeff Y. Tsao, Editor(s)

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