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Proceedings Paper

Normalized Correlation Search In Alignment, Gauging, And Inspection
Author(s): William M. Silver
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Paper Abstract

This paper is an in-depth look at determining the location and quality of image features by normalized correlation. We have investigated its accuracy, repeatability, and susceptibility to various forms of image degradation, and compared the results to other methods of locating features. We also present a novel, inexpensive device that performs the necessary computations very efficiently. The emphasis is on locating features for current, practical applications in manufacturing automation.

Paper Details

Date Published: 30 April 1987
PDF: 12 pages
Proc. SPIE 0755, Image Pattern Recognition: Algorithm Implementations, Techniques, and Technology, (30 April 1987); doi: 10.1117/12.940003
Show Author Affiliations
William M. Silver, Cognex Corporation (United States)

Published in SPIE Proceedings Vol. 0755:
Image Pattern Recognition: Algorithm Implementations, Techniques, and Technology
Francis J. Corbett, Editor(s)

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